SAMPLING DEVICE FOR THERMAL ANALYSIS
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United States of America Patent
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Issued Date -
Jun 16, 2016
app pub date -
Dec 15, 2015
filing date -
Dec 16, 2014
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Abstract
A sampling device for thermal analysis of solidifying metal is disclosed. The sampling device comprises at least a first cavity and a second cavity, the first and second cavities adapted to be filled with a molten metal to be analysed and each cavity adapted to comprise a temperature responsive means during thermal analysis. The inlet opening of the common filling inlet is arranged in a second plane essentially parallel to a first horizontal plane tangent to an uppermost portion of the sampling device and located below said first plane.
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