DEVICE FOR ANALYZING A SAMPLE GAS COMPRISING AN ION SOURCE

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United States of America Patent

APP PUB NO 20160189948A1
SERIAL NO

14912413

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A device for analyzing a sample gas comprises an ion source for generating primary ions, a reaction chamber to which the primary ions produced in the ion source and the sample gas to be analyzed can be supplied in order to form product ions by chemical ionization of components in the sample gas, and an analyzer/detector unit for determining different types of ions. A reaction space in the reaction chamber, within which the primary ions supplied to the reaction chamber and the product ions produced are guided and which extends between a first end facing the ion source and a second end facing the analyzer/detector unit, is surrounded by at least two electrodes which are in the form of helices which wind round a common axis with identical pitches and are offset with respect to one another in the direction of the axis. An AC voltage is applied to each of the electrodes.

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Patent Owner(s)

Patent OwnerAddress
UNIVERSITAT INNSBRUCK6020 INNSBRUCK

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
BREITENLECHNER, Martin Innsbruck, AT 2 4
HANSEL, Armin Innsbruck, AT 3 5

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