MAINTENANCE DEVICE, MAINTENANCE SYSTEM, AND METHODS FOR EXAMINING AN INSPECTION TARGET
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United States of America Patent
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Issued Date -
Jul 7, 2016
app pub date -
Jan 6, 2015
filing date -
Jan 6, 2015
priority date (Note) -
Abandoned
status (Latency Note)
Importance
Abstract
Devices, systems, and methods are provided for examining an inspection target. The maintenance device is connected to a configuration platform using a communication interface and receives a set of inspection target information from the configuration platform. The set of inspection target information is stored in a memory module of the maintenance device. An illumination source illuminates the inspection target and a sensor module obtains a set of inspection target features from the inspection target. Inspection target information is selected from the memory module based on the obtained set of inspection target features and the selected inspection target information is projected using an information projector.
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