METHOD FOR PRODUCING SiC EPITAXIAL WAFER

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United States of America Patent

APP PUB NO 20160208414A1
SERIAL NO

14913865

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Abstract

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The method for producing an SiC epitaxial wafer according to the present invention includes: a step of vacuum baking a coated carbon-based material member at a degree of vacuum of 2.0×10−3 Pa or less in a dedicated vacuum baking furnace; a step of installing the coated carbon-based material member in an epitaxial wafer manufacturing apparatus; and a step of placing an SiC substrate in the epitaxial wafer manufacturing apparatus and epitaxially growing an SiC epitaxial film on the SiC substrate.

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Patent Owner(s)

Patent OwnerAddress
SHOWA DENKO K KTOKYO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
MOMOSE, Kenji Chichibu-shi, Saitama, JP 17 278
MUTO, Daisuke Chichibu-shi, Saitama, JP 46 505
ODAWARA, Michiya Chichibu-shi, Saitama, JP 9 165
TAJIMA, Yutaka Chichibu-shi, Saitama, JP 18 213

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