Apparatus and methods for determining a pass/fail condition of a memory device
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United States of America Patent
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Mar 30, 2016
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Oct 1, 2010
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Abstract
Memory devices including an array of memory cells, a first buffer selectively connected to the array of memory cells and corresponding to a particular bit rank of a byte of information of a programming operation of the memory device, and a second buffer selectively connected to the array of memory cells and corresponding to the particular bit rank of a different byte of information of the programming operation of the memory device, wherein an output of the first buffer and an output of the second buffer are connected in parallel to a common line, as well as methods of their operation to indicate a pass/fail condition of the programming operation.
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