System and method for measuring the DC-transfer characteristic of an analog-to-digital converter
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United States of America Patent
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Feb 28, 2017
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Oct 19, 2015
filing date -
Jan 16, 2015
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Abstract
Systems and methods for measuring and compensating a DC-transfer characteristic of analog-to-digital converters are described. A test-signal generator comprising a sigma-delta modulator may provide calibration signals to an ADC. An output from the ADC may be filtered with a notch filter to suppress quantization noise at discrete frequencies introduced by the sigma-delta modulator. The resulting filtered signal may be compared against an input digital signal to the test-signal generator to determine a transfer characteristic of the ADC.
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