X-RAY PRODUCT QUALITY AUTOMATIC INSPECTION DEVICE

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United States of America Patent

SERIAL NO

14901989

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Abstract

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An X-ray product quality automatic inspection device of the present invention comprises: a distributed X-ray source having a plurality of targets and being able to generate X-rays for irradiating an inspected product from the plurality of targets in a predetermined sequence; a detector for receiving the X-rays generated by the distributed X-ray source and outputting a signal representing characteristics of the received X-rays; a transport device for carrying the inspected product to pass through an X-ray radiation region; and a power supply and control device, which is used to supply power to and control the X-ray product quality automatic inspection device, to form characteristic information of the inspected product according to the signal from the detector and to provides an inspection and analysis result of the inspected product according to the characteristic information.

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Patent Owner(s)

Patent OwnerAddress
NUCTECH COMPANY LIMITEDBEIJING 100084

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
CHEN, Zhiqiang Beijing, CN 403 2425
LI, Yuanjing Beijing, CN 271 1894
LIU, Zhuoyan Beijing, CN 4 64
QIN, Zhanfeng Beijing, CN 12 112
TANG, Huaping Beijing, CN 34 214
WANG, Yonggang Beijing, CN 104 1575

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