WRITING METHOD AND READING METHOD OF PHASE CHANGE MEMORY

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United States of America Patent

APP PUB NO 20160225445A1
SERIAL NO

14609595

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Abstract

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A writing method and a reading method of a phase change memory (PCM) are provided. The PCM has a plurality of memory cells. The writing method comprises the following steps. At least one stress pulse is applied for aging at least one of the memory cells. A starting pulse is applied to all of the memory cells of the PCM for increasing a resistance of each of the memory cells. A detection pulse is applied to all of the memory cells of the PCM for decreasing the resistance of each of the memory cells and detecting the resistance changing speed of each of the memory cells. A set pulse is applied to the aged memory cells. A reset pulse is applied to the non-aged memory cells.

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Patent Owner(s)

Patent OwnerAddress
MACRONIX INTERNATIONAL CO LTDNO 16 LI-HSIN RD SCIENCE-BASED INDUSTRIAL PARK HSINCHU R O C

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Lee, Ming-Hsiu Hsinchu City, TW 127 917
Wu, Chao-I Hsinchu City, TW 164 1092

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