METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

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United States of America Patent

APP PUB NO 20160225784A1
SERIAL NO

14740810

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Abstract

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According to one embodiment, a method for manufacturing a semiconductor device includes modifying surfaces of the first mask films and surfaces of the second mask films. The method includes setting back one first mask film in the first direction until a second mask film adjacent to the one first mask film in the first direction is exposed, by etching with selectivity with respect to modified surfaces of the first and second mask films, and broadening an exposed region of the multilayer body. The method includes etching one stacked film exposed at a surface side in the exposed region of the multilayer body, in the stacking direction.

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Patent Owner(s)

Patent OwnerAddress
KABUSHIKI KAISHA TOSHIBA1-1 SHIBAURA 1-CHOME MINATO-KU TOKYO 105-0023

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
OMURA, Mitsuhiro Kuwana, JP 48 706

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