METHOD AND SYSTEM FOR RATING MEASURED VALUES TAKEN FROM A SYSTEM

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United States of America Patent

APP PUB NO 20160239753A1
SERIAL NO

15024365

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Abstract

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A method for rating measured values taken from a system S that may be in an error-free or erroneous state, includes: forming, by a device, a set V of unmarked measured values v from the system S; forming, by the device, a modified learning set V′ comprising measured values v′ for a learning system L by removal or weighting or removal and weighting of measured values from the set V using a random-based method; forming, by the device, a model M for rating measured values from the system S by the learning system L from the modified learning set V′; and rating, by the device, measured values from the system S by a rating system B using the model M. At least one closest neighbor of the measured value v is removed during removal or weighting or removal and weighting of measured values v from the set V.

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Patent Owner(s)

Patent OwnerAddress
DEUTSCHE TELEKOM AGFRIEDRICH-EBERT-ALLEE 140 BONN 53113

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ketabdar, Hamed Berlin, DE 9 57
Loehlein, Bernhard Erlenbach, DE 2 6
Roshandel, Mehran Berlin, DE 3 22
Schuessler, Martin Moeser, DE 44 241
Shahin, Tajik Berlin, DE 1 5

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