AUTOMATED ADJUSTMENT OF SIGNAL ANALYSIS PARAMETERS FOR X-RAY DETECTORS
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
N/A
Issued Date -
N/A
app pub date -
Feb 2, 2016
filing date -
Feb 19, 2015
priority date (Note) -
Published
status (Latency Note)
Importance
Abstract
A method for the automated determination of an adjusted setting for signal analysis parameters of an x-ray detector is described. With an embodiment of the method, information relating to the dimensions of the object to be examined, the x-ray attenuation in the object to be examined, the nature of the examination and the examination region of the object to be examined is acquired. Signal analysis parameter values are then determined based on the acquired information. A method for automatically setting signal analysis parameters of an x-ray detector is also described. A facility for determining an adjusted setting for signal analysis parameters of an x-ray detector is also described. An x-ray system is also described.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully