MEASUREMENT APPARATUS

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United States of America Patent

SERIAL NO

15053376

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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The present invention provides a measurement apparatus which measures a shape of a target object, the apparatus including a projection unit configured to project, on the target object, line pattern light including a plurality of lines formed from light having a first wavelength and identification pattern light formed from light having a second wavelength different from the first wavelength and including an identification pattern of a plurality of dots for respectively identifying the plurality of lines, and an image sensing unit configured to obtain a first image corresponding to the line pattern light and a second image corresponding to the identification pattern light by separating the line pattern light and the identification pattern light projected on the target object based on wavelengths and sensing the line pattern light and the identification pattern light.

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Patent Owner(s)

Patent OwnerAddress
CANON KABUSHIKI KAISHA3-30-2 TOKYO JAPAN TOKYO TOKYO METROPOLIS

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Tokimitsu, Takumi Utsunomiya-shi, JP 14 52

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