METHOD FOR TESTING A DEVICE UNDER TEST AND A TEST DEVICE THEREFOR
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United States of America Patent
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Issued Date -
Sep 8, 2016
app pub date -
Jul 10, 2015
filing date -
Mar 6, 2015
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Abstract
A test device and method for performing a plurality of tests on a DUT, comprising a memory storing configuration data for the plurality of tests, said configuration data defining parameters for at least one list of receive tests; an RF signal generator; an RF signal analyser; and a test sequencer for executing the tests. The test sequencer configures the test device for execution of each list of receive tests, whereby, for each test: the RF signal analyser is arranged to receive a command signal from the DUT, the test sequencer is arranged to retrieve from the memory configuration data for the next test to be executed based on the command signal and to configure the RF signal generator using the configuration data; the RF signal generator is arranged to transmit a test signal to the DUT according to the configuration data.
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