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Abstract

Example apparatus and methods for performing measurements on an optical device are described for characterizing the optical device. An interrogating laser light source generates light at multiple different wavelengths during a single sweep of the laser light source. One or more optical interferometric interrogators are connected to the interrogating laser light source and connectable to the optical device such that light from the laser is coupled to the optical device and light from the optical device is received by the one or more optical interferometric interrogators in multiple different directions along a number of optical interferometric measurement paths. Optical detection circuitry detects an optical interference pattern, for each of the number of optical interferometric light paths, generated during the single sweep of the interrogating laser light source. Data processing circuitry determines one or more optical parameters associated with a response determined for each of the number of optical interferometric light paths based on the optical interference pattern detected for each of the number of optical interferometric light paths generated during the single sweep of the interrogating laser.

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