Information processing apparatus, information processing method, and storage medium utilizing technique for detecting an abnormal state such as a scratch on a target
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United States of America Patent
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Dec 18, 2018
Grant Date -
Sep 15, 2016
app pub date -
Mar 8, 2016
filing date -
Mar 10, 2015
priority date (Note) -
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status (Latency Note)
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Abstract
An information processing apparatus for, to classify and detect a plurality of types of defects, detecting a defect in a target object without using data obtained by prior learning includes an acquisition unit configured to acquire an image group obtained by capturing a target object irradiated with light from a plurality of illumination units placed at a plurality of different positions, a generation unit configured to, based on luminance information of images included in the image group, generate a first luminance profile indicating a change in a luminance value of a first region, which is a region corresponding between the images, and a second luminance profile indicating a change in a luminance value of a second region, which is a region corresponding between the images, and a detection unit configured to detect a defect in the target object based on the first luminance profile and the second luminance profile.
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