METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

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United States of America Patent

SERIAL NO

14843917

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Abstract

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According to one embodiment, a method for manufacturing a semiconductor device, includes: selectively forming a plurality of electrode layers on a first surface of a semiconductor substrate, the semiconductor substrate having the first surface and a second surface; and dividing the semiconductor substrate by forming a gap piercing from the first surface to the second surface of the semiconductor substrate, the gap being formed by dry etching the first surface of the semiconductor substrate exposed between the plurality of electrode layers, the plurality of electrode layers being used as masks.

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Patent Owner(s)

Patent OwnerAddress
KABUSHIKI KAISHA TOSHIBAMINATO-KU TOKYO 105-0023

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
MATSUI, Satoshi Yokohama Kanagawa, JP 73 1431
MATSUO, Mie Kamakura Kanagawa, JP 70 1815
TAKUBO, Chiaki Sumida Tokyo, JP 78 1534

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