Parallel optical thin film measurement system for analyzing multianalytes
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United States of America Patent
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Oct 10, 2017
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app pub date -
Dec 20, 2013
filing date -
Dec 20, 2013
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Abstract
Optical computing devices including a light source that emits electromagnetic radiation into an optical train that extends from the light source to a detector, a substance arranged in the optical train and configured to optically interact with the electromagnetic radiation and produce sample interacted radiation, an integrated computational element (ICE) array arranged in the optical train and including a plurality of ICE cores arranged on a substrate, and a variable weighting array arranged in the optical train and including a plurality of weighting devices arranged on a weighting substrate, the plurality of weighting devices being configured to optically apply corresponding weighting factors to beams of modified electromagnetic radiation prior to being received by the detector, wherein the detector generates an output signal indicative of a characteristic of the substance based on the plurality of beams of modified electromagnetic radiation.
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