Integrated Circuit Including a Programmable Logic Analyzer with Enhanced and Debugging Capabilities and a Method Therefor

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United States of America Patent

SERIAL NO

15176551

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Abstract

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A system including an embedded logic analyzer block having an input receiving a plurality of signals from a system under test, and a trigger event block detecting an occurrence of an event based in part upon the plurality of signals. The system further includes a block with a first input receiving one or more of the plurality of signals, a second input receiving a signal based upon the detection of the occurrence of the event, circuitry generating a distinct set test signals based on the signals at the first input and second input of the block, the distinct set of test signals being different from the plurality of signals appearing at the input of the embedded logic analyzer block, and an output providing the generated distinct set of test signals to the embedded logic analyzer block as additional test signals for at least one of sampling thereof and event triggering.

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Patent Owner(s)

Patent OwnerAddress
LEXMARK INTERNATIONAL INC740 WEST NEW CIRCLE ROAD LEXINGTON KY 40550

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Bailey, James Ray Brentwood, US 24 182
Langevin, Eric David Lexington, US 5 11
Sharpe, James Patrick Lexington, US 4 30

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