Memory controller, memory control method, and coefficient decision method

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United States of America Patent

PATENT NO 9773563
SERIAL NO

14755900

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Abstract

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According to one embodiment, a distribution of threshold voltages of a plurality of memory cells is acquired from a nonvolatile memory which includes the plurality of memory cells, a malfunction state occurring in the nonvolatile memory is identified based on a shape of the distribution, and a read voltage when data is read out of the nonvolatile memory is set to a voltage value corresponding to a type of the malfunction state.

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Patent Owner(s)

  • TOSHIBA MEMORY CORPORATION

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Atsumi, Tsuyoshi Ota, JP 14 45

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