ADVANCED 4-DIMENSIONAL SIGNAL AND DEVICE TESTING USING CIRCUIT-STATE RECOGNITION

Number of patents in Portfolio can not be more than 2000

United States of America Patent

APP PUB NO 20160291088A1
SERIAL NO

15178418

Stats

ATTORNEY / AGENT: (SPONSORED)

Importance

Loading Importance Indicators... loading....

Abstract

See full text

The Fast Fourier transform describes functions into different dimensions or coordinates such as Cartesian to spherical. For example, a function could be represented in the domains of time and frequency. The concept of the 3-D FFT has the same form as the mathematical representation of the 2-D FFT utilizing a 1-D FFT. This technique is essentially a spatial filtering operation in which the hologram functions as a matched filter. It has been applied here, to function as 4-D FFT by adding the dimension of time to recognize the presence of a specific electronic circuit and detect the moment when specific voltage levels or signals are present within or acting upon, the circuit or device under test and development. Any dynamic changes in the test object from ideal or recorded conditions, such as by defects in the device under test's circuitry or from prescribed voltage or signal induced operating parameters, will not result in the reconstruction of the desired object wave or holographic image.

Loading the Abstract Image... loading....

First Claim

See full text

Family

Loading Family data... loading....

Patent Owner(s)

Patent OwnerAddress
ATTOFEMTO INC14535 WESTLAKE DRIVE SUITE A-1 LAKE OSWEGO OR 97035-7775

International Classification(s)

  • [Classification Symbol]
  • [Patents Count]

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Pfaff, Paul L Lake Oswego, US 16 265

Cited Art Landscape

Load Citation

Patent Citation Ranking

Forward Cite Landscape

Load Citation