Metrics and Semiparametric Model Estimating Failure Rate and Mean time Between Failures

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United States of America Patent

APP PUB NO 20150100284A1
SERIAL NO

14047879

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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Techniques for predicting a failure metric of a physical system using a semiparametric model, including providing raw data representative of the physical system, to identify a set of units at risk in the physical system, a set of times of treatment corresponding to a event of at least one unit in the set of units, and an index-set of the at least one unit for which a event has occurred. A parametric and a nonparametric component of the semiparametric model are estimated and a hazard rate is predicted at a given time with the semiparametric model.

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Patent Owner(s)

  • THE TRUSTEES OF COLUMBIA UNIVERSITY IN THE CITY OF NEW YORK

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Anderson, Roger N New York, US 74 5207
Boulanger, Albert New York, US 22 1014
Teravainen, Timothy New York, US 2 14
Wu, Leon L New York, US 22 886

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