Importance

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Abstract

A testing device for measuring the light characteristics of an electronic component includes an inlet at one end at which an electronic component can be presented for testing. A shutter is located at the inlet and is moveable between a first open position in which an electronic component can be received into the inlet, and a second closed position in which the shutter can overlay at least the majority of a nest on which said electronic component is supported, so that the shutter prevents light emitted by the electronic component from being diverted away from the testing device. The shutter includes at least one sliding door that can be slid to move the shutter into its first and second open positions. The at least one sliding door includes a cut out portion that defines said opening when the shutter is in its second closed position.

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First Claim