Systems and methods for testing a clamp function for insulated gate bipolar transistors

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United States of America Patent

PATENT NO 9720030
SERIAL NO

14733589

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Abstract

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An integrated circuit includes an insulated gate bipolar transistor (“IGBT”), a clamp element coupled to a control gate of the IGBT to allow current flow in a first direction when voltage is applied to the control gate of the IGBT, and a blocking element coupled to the control gate of the IGBT and to the clamp element. The blocking element allows current flow in a second direction when voltage is removed from the control gate of the IGBT, the second direction is opposite the first direction. A resistive element has a first terminal and a second terminal, the first terminal is coupled between an anode of the clamping element and an anode of the blocking element and the second terminal is coupled to an output of test circuitry.

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Patent Owner(s)

  • NXP USA, INC.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Sicard, Thierry Austin, US 48 294

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