CIRCUITS, METHODS, AND MEDIA FOR DETECTING AND COUNTERING AGING DEGRADATION IN MEMORY CELLS
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United States of America Patent
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Issued Date -
Dec 8, 2016
app pub date -
Aug 22, 2016
filing date -
Feb 7, 2015
priority date (Note) -
Abandoned
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Abstract
Circuits for estimating threshold voltages of transistors in memory device bitcells are provided. The circuits use a multiplexer, a sensor switch network, a power switch network, and an NMOS device configured as a sensor to couple a desired one the transistors in the bitcells and the NMOS device to each other, to a test voltage, and to ground. A sensor voltage node can then be measured, and based on the resulting measurement, a threshold voltage for the transistor estimate.
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