ON-CHIP TEST CIRCUIT FOR MAGNETIC RANDOM ACCESS MEMORY (MRAM)
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
N/A
Issued Date -
N/A
app pub date -
Jun 24, 2015
filing date -
Jun 24, 2015
priority date (Note) -
Published
status (Latency Note)
Importance
Abstract
Embodiments include a test circuit to test one or more magnetic tunnel junctions (MTJs) of a magnetic random access memory (MRAM). The test circuit may measure a 1/f noise of the MTJ in the time domain, and determine a power spectral density (PSD) of the 1/f noise. The test circuit may estimate one or more parameters of the MTJ and/or MRAM based on the PSD. For example, the test circuit may determine a noise parameter, such as a Hooge alpha parameter, based on the PSD, and may estimate the one or more parameters of the MTJ and/or MRAM based on the 1/f parameter. Other embodiments may be described and claimed.
First Claim
Family
International Classification(s)
- [Classification Symbol]
- [Patents Count]
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully