LOW-K SPACER FOR RMG FINFET FORMATION

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United States of America Patent

SERIAL NO

15298828

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Abstract

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A method for semiconductor fabrication includes providing mask layers on opposite sides of a substrate, the substrate having one or more mandrels. Dummy spacers are formed along a periphery of the mask layers. A dummy gate structure is formed between the dummy spacers. The dummy spacers are removed to provide a recess. Low-k spacers are formed in the recess.

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Patent Owner(s)

Patent OwnerAddress
INTERNATIONAL BUSINESS MACHINES CORPORATIONNEW ORCHARD ROAD ARMONK NY 10504

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
He, Hong Schenectady, US 1191 7763
Tseng, Chiahsun Wynantskill, US 64 384
Yamashita, Tenko Schenectady, US 599 4981
Yeh, Chun-Chen Clifton Park, US 417 3476
Yin, Yunpeng Niskayuna, US 96 1365

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