HIGHLY REFLECTIVE SURFACE PROFILE MEASUREMENT SYSTEM WITH AIR CONDENSATION AND METHOD THEREOF

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United States of America Patent

APP PUB NO 20170052023A1
SERIAL NO

14872876

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Abstract

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The present disclosure provides a system and a method thereof for measuring highly reflective surface profile with air condensation. The method, suitable for measuring an article's shiny surface, includes the following steps: reducing the temperature of the air surrounding the article; performing an optical scanning toward the article's surface as to get a photoelectric signal; and processing the signal.

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Patent Owner(s)

Patent OwnerAddress
INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTENO 195 SEC 4 CHUNG HSING RD CHUTUNG HSINCHU 31040

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
CHEN, Chien-Chih Taichung, TW 199 1412
HUNG, Kuo-Feng Taoyuan, TW 13 20

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