Multi-channel testing

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United States of America Patent

PATENT NO 9633748
SERIAL NO

14828144

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Abstract

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Apparatus and methods can include an interface chip that can include a test channel to couple to a memory tester, a memory channel controller to couple with a plurality of memory arrays via a plurality of memory channels, and a test circuit coupled between the test channel and the channel controller, the test circuit to provide first and second test clock information to the memory channel controller. In certain examples, the test circuit can operate to receive multiple commands and to propagate the multiple commands to groups of memory channels substantially simultaneously in order to test cross-channel interference using the multi-channel memory. Additional apparatus and methods are disclosed.

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Patent Owner(s)

  • MICRON TECHNOLOGY, INC.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Shibata, Tomoyuki Kokubunji, JP 112 779

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