METHOD AND SYSTEM FOR PATTERN DETECTION, CLASSIFICATION AND TRACKING
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United States of America Patent
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Issued Date -
Mar 23, 2017
app pub date -
Jun 11, 2015
filing date -
Jun 12, 2014
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Abstract
A method for pattern detection, classification and tracking is provided herein. The method may include: illuminating a scene according to specified illumination parameters; capturing image frames of the scene by exposing a capturing device, wherein the exposures are synchronized with reflections originated by the illuminating, according to specified synchronization parameters; obtaining one or more pattern to be detected; and detecting the one or more pattern to be detected in the captured images, based on a database of a plurality of patterns, wherein the specified illumination parameters and the specified synchronization parameters are selected such that the at least one pattern to be detected is more detectable at the captured image frames.
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