DRAM Capacitors and Methods for Forming the Same

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United States of America Patent

APP PUB NO 20170117282A1
SERIAL NO

15334278

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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Embodiments provided herein describe capacitor stacks and methods for forming capacitor stacks. A first electrode is formed above a substrate. A dielectric layer is formed above the first electrode. The dielectric layer includes zirconium. A second electrode is formed above the dielectric layer. At least one of the first electrode and the second electrode includes iridium.

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Patent Owner(s)

Patent OwnerAddress
INTERMOLECULAR INC3011 N FIRST STREET SAN JOSE CA 95134

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Higuchi, Randall San Jose, US 7 60
Mathur, Monica S Dublin, US 1 7
Ngo, Thong Quang San Jose, US 1 7
Niyogi, Sandip San Jose, US 26 518
Phatak, Prashant San Jose, US 38 1129

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