ELECTRONIC TEST EQUIPMENT
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United States of America Patent
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Issued Date -
May 25, 2017
app pub date -
Nov 19, 2015
filing date -
Nov 19, 2015
priority date (Note) -
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Abstract
An electronic test equipment is adapted to test an electronic component. The electronic component has a circuit body and a plurality of connectors that are electrically connected to the circuit body. The electronic test equipment includes a metallic test seat and a plurality of spring probes. The metallic test seat is adapted to support the circuit body thereon, and is formed with a plurality of spaced-apart probe holes extending therethrough and possessing diameters that are substantially the same. Each of the probe holes is adapted to receive a corresponding one of the connectors. The spring probes are respectively and entirely positioned within the probe holes, and are adapted to electrically contact the connectors.
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