UPPER LAYER-FORMING COMPOSITION AND RESIST PATTERNING METHOD

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United States of America Patent

SERIAL NO

14978672

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A liquid immersion lithography upper-layer film-forming composition includes (A) a polymer that includes a structural unit (I) shown by the following formula (1), and (S) a solvent. R1 in the formula (1) represents a hydrogen atom, a methyl group, or a trifluoromethyl group. The polymer (A) preferably further includes a structural unit (II) that includes a sulfo group. The polymer (A) preferably further includes a structural unit (III) shown by the following formula (3). R2 in the formula (3) represents a hydrogen atom, a methyl group, or a trifluoromethyl group. R3 represents a linear or branched monovalent hydrocarbon group having 1 to 12 carbon atoms or a monovalent alicyclic group having 3 to 20 carbon atoms, provided that at least one hydrogen atom of the hydrocarbon group or the alicyclic group is substituted with a fluorine atom.

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Patent Owner(s)

  • JSR CORPORATION

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hayama, Takahiro Tokyo, JP 16 50
Kusabiraki, Kazunori Tokyo, JP 10 27
Maruyama, Ken Tokyo, JP 52 110
Nishimura, Yukio Tokyo, JP 61 694
Tanaka, Kiyoshi Tokyo, JP 88 1339

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