Technique for determining performance characteristics of electronic devices and systems
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United States of America Patent
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May 22, 2018
Issued Date -
N/A
app pub date -
Dec 22, 2016
filing date -
Mar 7, 2001
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Abstract
A technique for determining performance characteristics of electronic devices and systems is disclosed. In one embodiment, the technique is realized by measuring a first response on a first transmission line from a single pulse transmitted on the first transmission line, and then measuring a second response on the first transmission line from a single pulse transmitted on at least one second transmission line, wherein the at least one second transmission line is substantially adjacent to the first transmission line. The worst case bit sequences for transmission on the first transmission line and the at least one second transmission line are then determined based upon the first response and the second response for determining performance characteristics associated with the first transmission line.
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