APPARATUS AND METHOD FOR LOCALIZING DEFECT LOCATION AND APPARATUS AND METHOD FOR IDENTIFYING CAUSE OF DEFECT IN OPTICAL TRANSPORT NETWORK (OTN) BASED ON TANDEM CONNECTION MONITORING (TCM) COORDINATES AND DEFECT TRACEBACK
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United States of America Patent
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Aug 3, 2017
app pub date -
Jan 5, 2017
filing date -
Jan 29, 2016
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Abstract
A method of localizing a defect location and a method of identifying a cause of a defect in an optical transport network (OTN). The method of localizing a defect location in an OTN includes generating tandem connection monitoring (TCM) coordinates consisting of a TCM level and trail information of an optical data unit (ODU) based on a relationship between an OTN line card (LC) and the ODU in the OTN, localizing the defect location in the OTN by converting the TCM level to a segment on the TCM coordinates, and identifying a root cause using a defect identification algorithm that traces back the cause of the defect in an opposite direction to that in which the defect is propagated based on an OTN layer structure.
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