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United States of America Patent

SERIAL NO

15502533

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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Before a sample is pierced with a probe of a PESI ion source, a total ion current is measured under a condition with no voltage applied from a high voltage generator to the probe as well as under a condition with the voltage applied. If the probe is properly attached to the holder, a considerable difference in total ion current occurs between the period with no voltage applied and the period with the voltage applied. By comparison, if the probe is improperly attached, no significant difference in the total ion current occurs between the period with no voltage applied and the period with the voltage applied. Referring to a threshold determined under the normal condition, a probe attachment checker detects an insufficient attachment of the probe by checking the difference in the total ion current, and displays an error message on a display unit if an improper attachment is detected.

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Patent Owner(s)

Patent OwnerAddress
SHIMADZU CORPORATIONKYOTO 604-8511

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
UCHIDA, Takeshi Kyoto-shi, Kyoto, JP 118 704
UEDA, Hiroko Joyo-shi, Kyoto, JP 21 392

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