PHASE-ERROR COMPENSATION METHOD AND DEVICE

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United States of America Patent

APP PUB NO 20170241772A1
SERIAL NO

15125505

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Abstract

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A phase-error compensation method and device, comprising: utilizing a phase-shifting-profilometry measuring system to obtain fringe sequence charts; based on Hilbert transform, transforming the fringe sequence charts from a space domain to a Hilbert transform domain; based on least squares phase shift method, solving the phases of the fringe sequence charts in the space domain and the Hilbert transform domain respectively, and obtaining a phase chart in the space domain and a phase chart in the Hilbert transform domain; averaging the phase chart in the space domain and the phase chart in the Hilbert transform domain to obtain an average phase, and utilizing the average phase to perform phase-error compensation. The invention possesses a self-compensation mechanism, does not need any auxiliary condition, and thus meets the requirements of high-speed, high-precision and high-universality 3D digital imaging and measuring based on the phase shifting profilometry.

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Patent Owner(s)

Patent OwnerAddress
SHENZHEN UNIVERSITYNO 3688 NANHAI AVENUE YUEHAI STREET NANSHAN DISTRICT SHENZHEN CITY GUANGDONG PROVINCE SHENZHEN CITY GUANGDONG PROVINCE 518000

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
CAI, Zewei Shenzhen, CN 1 0
HE, Wenqi Shenzhen, CN 4 1
JIANG, Hao Shenzhen, CN 171 1156
LIU, Xiaoli Shenzhen, CN 69 145
PENG, Xiang Shenzhen, CN 45 1240

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