FILM STRESS UNIFORMITY CONTROL BY RF COUPLING AND WAFER MOUNT WITH ADAPTED RF COUPLING

Number of patents in Portfolio can not be more than 2000

United States of America Patent

SERIAL NO

15516063

Stats

ATTORNEY / AGENT: (SPONSORED)

Importance

Loading Importance Indicators... loading....

Abstract

See full text

A fixture or clamp for a wafer in a vacuum treatment system has a non-conductive body with a first plane surface for arranging a substrate (wafer) thereon and a second surface opposite to first surface. A body includes a plurality of electrode-pairs; each electrode pair comprising a first electrode with a first electrode surface and a second electrode with a second electrode surface, electrode surfaces interconnected via a conductive member and arranged essentially in parallel to the first and second surfaces, the first electrode located closer to the first surface than the second electrode and the second electrode located closer to the second surface than the first electrode. Such a body can be used for RF coupling between the wafer and pedestal on RF potential to achieve a uniform film stress profile/distribution during film deposition or other substrate treatment.

Loading the Abstract Image... loading....

First Claim

See full text

Family

Loading Family data... loading....

Patent Owner(s)

Patent OwnerAddress
EVATEC AGHAUPTSTRASSE 1A TRUEBBACH 9477

International Classification(s)

  • [Classification Symbol]
  • [Patents Count]

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
BALON, Frantisek Buchs, CH 10 28

Cited Art Landscape

Load Citation

Patent Citation Ranking

Forward Cite Landscape

Load Citation