MEASUREMENT APPARATUS, SYSTEM, MEASUREMENT METHOD, AND ARTICLE MANUFACTURING METHOD

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United States of America Patent

APP PUB NO 20170255181A1
SERIAL NO

15446248

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Abstract

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A measurement apparatus including an imaging device configured to perform imaging of an object to output image information, and perform measurement of arrangement of the object in a state where at least one of the object and the imaging device is moving, comprising: a processor configured to obtain information of the arrangement based on the output image information, wherein the processor is configured to perform a process of synchronization between the imaging and measurement of a position of the at least one.

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Patent Owner(s)

Patent OwnerAddress
CANON KABUSHIKI KAISHA30-2 SHIMOMARUKO 3-CHOME OHTA-KU TOKYO 1468501 ?1468501

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Yamada, Akihiro Sakura-shi, JP 170 1580

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