Recording medium, method of manufacturing fullerene thin film, recording reproducing apparatus, information recording method, and information reading method

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United States of America Patent

PATENT NO 10008232
SERIAL NO

15529614

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Abstract

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According to the present invention, there is provided a recording medium comprising a substrate, a platinum layer formed on the substrate and having a (111) plane preferentially oriented, and a fullerene single crystal thin film formed on the platinum layer, and configured to be a recording layer, wherein an average value of average surface roughness Ra's with respect to four or more visual fields measured by using an atomic force microscope in a surface of the fullerene thin film is 0.5 nm or less.

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Patent Owner(s)

  • EC-SHOWA DENKO K.K.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hanawa, Kenzo Tokyo, JP 58 456
Ichikawa, Masatoshi Tokyo, JP 21 159
Tonegawa, Sho Tokyo, JP 11 3

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