PROCESS AND ASSEMBLY FOR TESTING ELECTRICAL AND OPTICAL PARAMETERS OF A PLURALITY OF LIGHT-EMITTING DEVICES
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
N/A
Issued Date -
N/A
app pub date -
Sep 30, 2015
filing date -
Nov 5, 2014
priority date (Note) -
Published
status (Latency Note)
Importance
Abstract
According to the present invention there is provided a method for testing electrical and optical parameters of a group of light-emitting devices, the method comprising the steps of, bringing the group of devices to a test position wherein light emitted by the devices in the group can be received into an integrating sphere; performing, electrical testing of the devices in the group in parallel, so that electrical parameters of each of the devices in the group can be determined; performing, in a sequential device-by-device manner, optical testing of the devices in the group, so that optical parameters of each of the devices in the group can be determined. There is further provided a corresponding assembly.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Advertisement
Advertisement
Advertisement
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully