IC TEST SITE VISION ALIGNMENT SYSTEM

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United States of America Patent

SERIAL NO

15472006

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Abstract

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A vision alignment system for a test handler system includes a transfer mechanism that transfers a device from an input side to a test side, a contactor array positioned at the test side, and a pick-and-place device that moves the device from the transfer mechanism to the contactor array. An engagement mechanism on the pick-and-place device engages with alignment devices on the transfer mechanism and contactor array. To avoid positioning the vision alignment system in the test side, a first vision mechanism is positioned away from the test socket and determines the position of the device in a common local coordinate system, a second vision mechanism is positioned at an output side and determines a position of the contactor array in the local coordinate system, and the correction mechanism corrects a position of the device based on an offset between the positions in the coordinate system.

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Patent Owner(s)

Patent OwnerAddress
DEUTSCHE BANK AG NEW YORK BRANCH AS COLLATERAL AGENT60 WALL STREET NEW YORK NY 10005

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
DING, Kexiang Ken San Diego, US 19 173
FRANDSEN, James Ramona, US 5 16
KABBANI, Samer Encinitas, US 55 926
LAVER, Michael Anthony El Cajon, US 7 45
STUCKEY, Larry Poway, US 10 88

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