ORGANIC PROCESSING LIQUID AND PATTERN FORMING METHOD

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United States of America Patent

SERIAL NO

15629985

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Abstract

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Disclosed herein are an organic processing liquid for resist film patterning which is capable of suppressing the occurrence of defects in resist patterns, and a pattern forming method. Provided is an organic processing liquid for resist film patterning, which is used to carry out at least one of developing or cleaning of a resist film obtained from an actinic ray-sensitive or radiation-sensitive composition, the liquid including an organic solvent, in which the content of an oxidant in the organic processing liquid is 10 mmol/L or less.

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Patent Owner(s)

Patent OwnerAddress
FUJIFILM CORPORATION26-30 NISHIAZABU 2-CHOME MINATO-KU TOKYO 106-8620

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
TSUBAKI, Hideaki Haibara-gun, JP 99 2132
TSUCHIHASHI, Toru Haibara-gun, JP 41 227
YAMAMOTO, Kei Haibara-gun, JP 117 602

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