METHOD OF AUTHENTICATING A POLYMER FILM BY THICKNESS MEASUREMENT WITH A WHITE LIGHT INTERFEROMETER
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United States of America Patent
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Jun 30, 2017
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Apr 28, 2008
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Abstract
A method of authenticating a polymer film comprises measuring the thickness of a layer therein by white light interferometry and/or measuring the birefringence of a layer therein. The method, and devices to carry out the method, may be used in security applications, for example to test for counterfeit bank notes.
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