STATUS DETERMINATION DEVICE AND STATUS DETERMINATION METHOD

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United States of America Patent

SERIAL NO

15507810

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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The present invention addresses the problem of making it possible to distinguish and detect cracking, peeling, internal cavities, and other defects through the remote observation of a structure. A status determination device according to the present invention is provided with a displacement calculation unit for calculating a two-dimensional spatial distribution of the displacement of a structure surface from time series images of the structure surface before and after load application and an abnormality determination unit for identifying flaws in the structure on the basis of a comparison of the two-dimensional spatial distribution and an already provided spatial distribution of displacement.

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Patent Owner(s)

Patent OwnerAddress
NEC CORPORATIONTOKYO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
IMAI, Hiroshi Tokyo, JP 221 2086

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