Data Display System

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United States of America Patent

SERIAL NO

15501999

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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To improve diagnostic accuracy in diagnosing for abnormality of a machine, it is necessary to adjust a parameter regarding diagnosis such as the number of clusters. In such an adjustment operation, each time a diagnostic parameter is modified, a checking operation by an analysis operator is required to see whether a diagnosis result has been improved. The present invention assists in the checking operation to see whether diagnostic accuracy has been improved by comparing diagnosis results before and after parameter modification. If there are many items of sensor data for diagnosis, many items of abnormality degree data arise as analysis result. Many items of data pose a problem that comparing diagnosis results takes time. In the data display system, abnormality degree data that has changed largely before and after parameter modification is automatically found and displayed to the analysis operator. How much an abnormality degree has changed is determined as an abnormality degree change rate, i.e., a ratio between “abnormality degree difference due to change” and “modified parameter value difference”. Only abnormality degree data with a large change rate is displayed to the analysis operator. Additionally, a more suited parameter that was hidden, if found during a parameter modifying operation, is displayed and presented to the analysis operator.

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Patent Owner(s)

Patent OwnerAddress
HITACHI LTDTOKYO 100-8280

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
FUJISHIRO, Takahiro Tokyo, JP 56 1565
HIRUTA, Tomoaki Tokyo, JP 40 603
SAKIMURA, Shigetoshi Tokyo, JP 21 134
TAKADO, Kazuyuki Tokyo, JP 2 3
UCHIDA, Takayuki Tokyo, JP 90 574

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