Importance

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Abstract

Implementations for probabilistic thermal hotspot accommodation are disclosed herein. In an example aspect, a cell library includes cells having respective leakage current characteristics that include a leakage current variability as well as a leakage current average. In another example aspect, a method obtains cell attribute collections for respective types of multiple cells, with each of the cell attribute collections including a leakage current average and a leakage current variability corresponding to a circuit device of a respective type of cell. The method also obtains an integrated circuit design that describes how multiple circuit devices are interconnected. The method then performs a thermal analysis of the integrated circuit design using the cell attribute collections for the respective types of multiple cells including at least the leakage current variability and the leakage current average.

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First Claim