Fault detection using event-based predictive models

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United States of America Patent

PATENT NO 10444121
APP PUB NO 20170322120A1
SERIAL NO

15144846

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Abstract

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A proposed solution to analyze event data from sensors of devices of a manufacturing environment to identify relationships of events to predict faults in devices is disclosed. The analysis includes conditional probability model and Apriori model. The relationships are used to determine a device health index which is compared to real-time event data to predict faults in a device.

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Patent Owner(s)

  • SAP SE

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Wang, Chen Singapore, SG 418 3001

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