Dual measurement displacement sensing technique

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United States of America Patent

PATENT NO 10466030
APP PUB NO 20170328699A1
SERIAL NO

15593885

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Abstract

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A method for determining a length of a span of electrically conductive material, comprising a first voltage measurement across the entire span, and a second voltage measurement across a constant-length segment of the span. The dual measurements allow the calculation of the span length in a manner that is robust to many disturbances including ambient temperature, material temperature, and material stress and fatigue.

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Patent Owner(s)

  • AUBURN UNIVERSITY

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Beale, David G Auburn, US 11 170
Broughton, Royall M Auburn, US 8 33
Gurley, Austin R Leeds, US 3 2

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