SURFACE MEASUREMENT PROBE

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United States of America Patent

SERIAL NO

15522127

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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Surface measurement probe comprising:

    a hollow probe body extending along a longitudinal axis and comprising a proximal end adapted to be mounted to a test apparatus and a distal end;a retaining arrangement situated inside the probe body and extending along said longitudinal axis, the retaining arrangement being arranged to maintain the surface measurement probe in an assembled state;a probe tip supported at the distal end of the probe body and arranged to contact a sample;a bead situated inside the probe body and interposed between the probe tip and the retaining arrangement, the bead comprising a thermally-insulating material.

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Patent Owner(s)

Patent OwnerAddress
ANTON PAAR TRITEC SA2034 PESEUX

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
BELLATON, Bertrand Neuchâtel, CH 8 31
CONTE, Marcello Neuchâtel, CH 5 9

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