Method of measuring display delay time, display device, and method of manufacturing display

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United States of America Patent

PATENT NO 9918078
SERIAL NO

15681631

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Abstract

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A method of measuring a display delay time includes a step where a display pattern displayed on a first display including i (i is a natural number greater than 2) display elements is switched to a display pattern other than the display pattern at every elapse of a pattern continuation time, and j (j is a natural number, 1

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Patent Owner(s)

  • SEIKO EPSON CORPORATION

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ichikawa, Tatsuya Nagano, JP 37 209
Shiohara, Ryuichi Nagano, JP 128 1392

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